Onto Innovation Announces Third Customer has Qualified the Atlas® V System for Gate-All-Around Development and Pilot Production
WILMINGTON, Mass.–(BUSINESS WIRE)–$ONTO #GAA–Onto Innovation Inc. (NYSE: ONTO) (“Onto Innovation,” “Onto,” or the “Company”) today announced it has received repeat orders of its Atlas® V optical critical dimension (OCD) platform for its uniquely powerful metrology solution for gate-all-around (GAA) / nanosheet transistors, the next-generation device architecture for advanced logic. “The GAA device is extremely challenging […]